Here are the results of a test with bad pixel correction done in the year 2003 and presented on the ASTM January 2004 meeting in Tampa.
The main question was if a detector with bad pixel can be allowed to be used for critical inspections. The post before gives the answer but the test results may be interesting, too.
The test was done to show the influence of plaque hole penetrameter visibility with different bad pixel correction maps. The correction of a single bad pixel is already discussed above, now the procedure of Multipe Pixel Correction should be faced:
The blue marked pixel are used two times for correction. What happens in a 2x3 cluster?
Here we see two CLKs and the blue marked pixel with white letter are used three times for correction.
The correction of two line defects with two good pixel between two bad pixel shows a lot of pixel which are used three times for correction:
but the worst case is where there is only one good pixel between two bad pixel in the bad lines:
Here the middle pixel are used six times for correction
The next test is a bad pixel grid; single pixel are used four times for correction:
and the worst case is where all good pixel are surrounded by bad pixel and each pixel is used eight times for correction:
For the test we created a bad pixel list with rows/colums, two pixel distance:
then we “and” and “or” both lists
We did the test with 5 different spaces of the bad lines - from one pixel distance (worst case) up to 5 pixel distance between bad pixel lines:
We used a Thales FS30 detector with the X-Ray dose of 120kV, 1mA from a 0.6mm focal spot at 0.6m distance and no magnification. 16 frames were integrated. The test object is a 30mm thick Aluminum block with two penetrameter 2% and 1% (0.62 & 1.2). The block is moved from “bad pixel area” to “bad pixel area” for each image:
When we used the second worst case - two good lines between two bad lines - we really did not see big differences in the visibility of the penetrameter holes:
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We skipped the other distances and moved to the worst case with only one good pixel between two bad pixels and additionally the bad pixel grids:
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even in the 1:1 view it is hard to see the differences.
Therefore we applied a high pass filter 9x9 and still it is hard to see big differences.
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Finally we magnified to 2:1 and now you will see that the worst case 2-2 shows higher unsharpness - but it is funny that the 1T hole is not influenced by this unsharpness.
We had long discussions about this test. It may not be reprentative anymore as the detector technology has improved and this combination of scintillator and pixelsize (160µm thick active scintillator and 127µm pixel size with a SR
b of 160µm) may compensate due to the higher unsharpness of the scintillator the information ==> see posting above.
Please feel free to post your opinion here